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Yield Improvement

Einnosys offers various solutions for Yield Improvement, ranging from simple barcode scanning of the lot boxes to very complex analysis of yield related issues by correlating endto-end wafer data. Our team members have decades of experience in improving yield at all areas of Assembly, Test, Packaging factories and FABs. Request A Demo

In addition to implementing complex yield improvement projects, our staff has published technical papers on how to use innovative, out-of-the-box automation to improve yield in factories

Yield Improvement Solutions

Add SECS/GEM on Old/Legacy Equipment Through EIGEMBox

Yield Improvement - einnosys

Add SECS/GEM (automation) capability on existing or legacy equipment through our patent-pending product EIGEMBox

Advanced process Control (APC)

Yield Improvement - einnosys

With Decades of Fab & Assembly operations experience, EINNOSYS has developed various APC solutions to collect & analyze metrology data & adjust process recipe and parameters automatically

Fault Detection & Classification

Yield Improvement - einnosys

eInnoSys has successfully implemented several Fault Detection & Classification (FDC) projects at various fabs.

Case Studies

A Taiwan based fab saw yield improvement by 2% by using EIGEMBox for automation of Legacy Equipment

Prevented misprocessing of up to 100 wafers quarterly by analyzing metrology data and adjusting process recipes

At one wafer fab, eInnoSys implemented Fault Detection and Classification (FDC) system with cost savings of $120k per year

Yield Management Solutions

Host applications or station controllers that download and/or select recipes upon barcode or RFID scanning of lot boxes and remotely starting process

Collection and analysis of alarms, events and other critical process parameters from equipment through SECS/GEM or other means and correlating with other data such as that from MES or from other equipment

For Wafer FABs, correlating end-to-end wafer data: From epitaxial - inline process - inline metrology - electrical testing -Final Test

Use feedback and feed-forward approach to feed metrology data to process equipment to improve yield

For more information and pricing