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Critical Semiconductor Metrology for Four Dimensions (4D)

Critical Semiconductor Metrology for Four Dimensions (4D)
Whitepaper

Critical Semiconductor Metrology for Four Dimensions (4D)

Four Dimensions, a semiconductor probing leader since 1978, faced performance…

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Four Dimensions, a semiconductor probing leader since 1978, faced performance limitations with their existing SECS/GEM SDK while handling large-volume data transfer from CV Map metrology equipment to the fab host. The slow data transmission was unacceptable for one customer, while another required the addition of GEM300 and E84 capabilities. To address both challenges, Four Dimensions needed a trusted partner with strong expertise in SECS/GEM, GEM300, and E84 standards, along with integration services. They selected Einnosys for its proven technical capabilities and comprehensive support.

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📅 Posted by admin on February 2, 2026

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📧 mike.brown@einnosys.com